Microparticle Adhesion in Xerography. A Combined Atomic Force Microscopy and Inverse Gas Chromatography Approach

L.H.G.J. Segeren

Research output: ThesisPhD Thesis - Research UT, graduation UT

Original languageUndefined
Supervisors/Advisors
  • Vancso, G.J., Supervisor
  • van den Berg, J.W.A., Advisor
Award date21 Jun 2002
Place of PublicationEnschede
Publisher
Print ISBNs90 365 177 29
Publication statusPublished - 21 Jun 2002

Keywords

  • METIS-208249

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