Microparticle Adhesion in Xerography. A Combined Atomic Force Microscopy and Inverse Gas Chromatography Approach

L.H.G.J. Segeren

Research output: ThesisPhD Thesis - Research UT, graduation UT

Original languageUndefined
Supervisors/Advisors
  • Vancso, Gyula J., Supervisor
  • van den Berg, J.W.A., Advisor
Award date21 Jun 2002
Place of PublicationEnschede
Publisher
Print ISBNs90 365 177 29
Publication statusPublished - 21 Jun 2002

Keywords

  • METIS-208249

Cite this

Segeren, L.H.G.J.. / Microparticle Adhesion in Xerography. A Combined Atomic Force Microscopy and Inverse Gas Chromatography Approach. Enschede : Twente University Press (TUP), 2002. 198 p.
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author = "L.H.G.J. Segeren",
year = "2002",
month = "6",
day = "21",
language = "Undefined",
isbn = "90 365 177 29",
publisher = "Twente University Press (TUP)",
address = "Netherlands",

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Microparticle Adhesion in Xerography. A Combined Atomic Force Microscopy and Inverse Gas Chromatography Approach. / Segeren, L.H.G.J.

Enschede : Twente University Press (TUP), 2002. 198 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

TY - THES

T1 - Microparticle Adhesion in Xerography. A Combined Atomic Force Microscopy and Inverse Gas Chromatography Approach

AU - Segeren, L.H.G.J.

PY - 2002/6/21

Y1 - 2002/6/21

KW - METIS-208249

M3 - PhD Thesis - Research UT, graduation UT

SN - 90 365 177 29

PB - Twente University Press (TUP)

CY - Enschede

ER -