Microparticle Adhesion Studies by Atomic Force Microscopy

L.H.G.J. Segeren, B. Siebum, F.G. Karssenberg, J.W.A. van den Berg, Gyula J. Vancso

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined
Title of host publicationAtomic Force Microscopy in Adhesion Studies
EditorsJ. Drelich, K.L. Mittal
Place of PublicationLeiden
PublisherVSP
Pages309-344
Number of pages36
Publication statusPublished - 2005

Publication series

Name
ISSN (Print)0169-4243
ISSN (Electronic)1568-5616

Keywords

  • METIS-229013

Cite this

Segeren, L. H. G. J., Siebum, B., Karssenberg, F. G., van den Berg, J. W. A., & Vancso, G. J. (2005). Microparticle Adhesion Studies by Atomic Force Microscopy. In J. Drelich, & K. L. Mittal (Eds.), Atomic Force Microscopy in Adhesion Studies (pp. 309-344). Leiden: VSP.