Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide contenct in Co80Pt20:oxide thin films

W. Zhang, Simon A. Morton, P.K.J. Wong, Bin Lu, Y. Xu, Machiel Pieter de Jong, Wilfred Gerard van der Wiel, Gerrit van der Laan

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    Abstract

    Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 : WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.
    Original languageUndefined
    Pages (from-to)405001
    Number of pages5
    JournalJournal of physics D: applied physics
    Volume46
    Issue number40
    DOIs
    Publication statusPublished - 17 Sep 2013

    Keywords

    • EWI-24396
    • Condensed matter: electrical
    • IR-89181
    • magnetic and optical Surfaces
    • METIS-302685
    • interfaces and thin films

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