Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide contenct in Co80Pt20:oxide thin films

Wen Zhang; Simon A. Morton; P.K. Johnny Wong; Bin Lu; Y. Xu; Michel P. de Jong; Wilfred G. van der Wiel; Gerrit van der Laan

doi:10.1088/0022-3727/46/40/405001

Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide contenct in Co₈₀Pt₂₀:oxide thin films

Wen Zhang
, Simon A. Morton
, P.K. Johnny Wong
, Bin Lu
, Y. Xu
, Michel P. de Jong
, Wilfred G. van der Wiel
, Gerrit van der Laan

Research output: Contribution to journal › Article › Academic › peer-review

5 Citations (Scopus)

166 Downloads (Pure)

Abstract

Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 : WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.

Original language	English
Pages (from-to)	405001
Number of pages	5
Journal	Journal of physics D: applied physics
Volume	46
Issue number	40
DOIs	https://doi.org/10.1088/0022-3727/46/40/405001
Publication status	Published - 17 Sept 2013

Keywords

Condensed matter: electrical
Magnetic and optical Surfaces
Interfaces and thin films

Access to Document

10.1088/0022-3727/46/40/405001

ArticleFinal published version, 926 KBLicence: Taverne

Cite this

@article{e41afdf38a9840e2982886cdf15c78c8,

title = "Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide contenct in Co80Pt20:oxide thin films",

abstract = "Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 : WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.",

keywords = "Condensed matter: electrical, Magnetic and optical Surfaces, Interfaces and thin films",

author = "Wen Zhang and Morton, \{Simon A.\} and Wong, \{P.K. Johnny\} and Bin Lu and Y. Xu and \{de Jong\}, \{Michel P.\} and \{van der Wiel\}, \{Wilfred G.\} and \{van der Laan\}, Gerrit",

note = "eemcs-eprint-24396 ",

year = "2013",

month = sep,

day = "17",

doi = "10.1088/0022-3727/46/40/405001",

language = "English",

volume = "46",

pages = "405001",

journal = "Journal of physics D: applied physics",

issn = "0022-3727",

publisher = "Institute of Physics",

number = "40",

}

TY - JOUR

T1 - Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide contenct in Co80Pt20:oxide thin films

AU - Zhang, Wen

AU - Morton, Simon A.

AU - Wong, P.K. Johnny

AU - Lu, Bin

AU - Xu, Y.

AU - de Jong, Michel P.

AU - van der Wiel, Wilfred G.

AU - van der Laan, Gerrit

N1 - eemcs-eprint-24396

PY - 2013/9/17

Y1 - 2013/9/17

N2 - Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 : WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.

AB - Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 : WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.

KW - Condensed matter: electrical

KW - Magnetic and optical Surfaces

KW - Interfaces and thin films

U2 - 10.1088/0022-3727/46/40/405001

DO - 10.1088/0022-3727/46/40/405001

M3 - Article

SN - 0022-3727

VL - 46

SP - 405001

JO - Journal of physics D: applied physics

JF - Journal of physics D: applied physics

IS - 40

ER -