Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering

G. Pan, D.J. Mapps, M.A. Akhter, J.C. Lodder, P. ten Berge, P. ten Berge, H.Y. Wong, J.N. Chapmann

    Research output: Contribution to journalArticleAcademicpeer-review

    4 Citations (Scopus)
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    Abstract

    Very thin CoCr films deposited on different underlayers on glass disk substrates were studied by the magneto-optic Kerr effect, VSM, torque magnetometry and TEM selected area diffraction. Square or near square perpendicular loops were obtained from Co/Ti, CoCr/Au, CoCr/Al, CoCr/C and CoCr/Si films. TEM SAD study revealed that the crystalline structure is a key factor determining the magnetic anisotropy of the very thin CoCr films. In particular, the c-axis of the hep CoCr films which exhibit square perpendicular loops is perpendicular to the film plane whilst that of the CoCr films which exhibit a thin and flat perpendicular loop lies in the film plane. The texture of the very thin CoCr films deposited on different underlayers is mainly dependent on the structure and texture of underlayers. The relation between the structure of CoCr and its underlayers is discussed.
    Original languageUndefined
    Pages (from-to)21-28
    Number of pages8
    JournalJournal of magnetism and magnetic materials
    Volume0
    Issue number113
    DOIs
    Publication statusPublished - 1992

    Keywords

    • EWI-5608
    • SMI-TST: From 2006 in EWI-TST
    • METIS-129088
    • IR-24288
    • SMI-MAT: MATERIALS

    Cite this

    Pan, G. ; Mapps, D.J. ; Akhter, M.A. ; Lodder, J.C. ; ten Berge, P. ; ten Berge, P. ; Wong, H.Y. ; Chapmann, J.N. / Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering. In: Journal of magnetism and magnetic materials. 1992 ; Vol. 0, No. 113. pp. 21-28.
    @article{f4f00321536046c2b620b19176a20a8c,
    title = "Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering",
    abstract = "Very thin CoCr films deposited on different underlayers on glass disk substrates were studied by the magneto-optic Kerr effect, VSM, torque magnetometry and TEM selected area diffraction. Square or near square perpendicular loops were obtained from Co/Ti, CoCr/Au, CoCr/Al, CoCr/C and CoCr/Si films. TEM SAD study revealed that the crystalline structure is a key factor determining the magnetic anisotropy of the very thin CoCr films. In particular, the c-axis of the hep CoCr films which exhibit square perpendicular loops is perpendicular to the film plane whilst that of the CoCr films which exhibit a thin and flat perpendicular loop lies in the film plane. The texture of the very thin CoCr films deposited on different underlayers is mainly dependent on the structure and texture of underlayers. The relation between the structure of CoCr and its underlayers is discussed.",
    keywords = "EWI-5608, SMI-TST: From 2006 in EWI-TST, METIS-129088, IR-24288, SMI-MAT: MATERIALS",
    author = "G. Pan and D.J. Mapps and M.A. Akhter and J.C. Lodder and {ten Berge}, P. and {ten Berge}, P. and H.Y. Wong and J.N. Chapmann",
    note = "Imported from SMI Reference manager",
    year = "1992",
    doi = "10.1016/0304-8853(92)91242-L",
    language = "Undefined",
    volume = "0",
    pages = "21--28",
    journal = "Journal of magnetism and magnetic materials",
    issn = "0304-8853",
    publisher = "Elsevier",
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    }

    Pan, G, Mapps, DJ, Akhter, MA, Lodder, JC, ten Berge, P, ten Berge, P, Wong, HY & Chapmann, JN 1992, 'Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering', Journal of magnetism and magnetic materials, vol. 0, no. 113, pp. 21-28. https://doi.org/10.1016/0304-8853(92)91242-L

    Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering. / Pan, G.; Mapps, D.J.; Akhter, M.A.; Lodder, J.C.; ten Berge, P.; ten Berge, P.; Wong, H.Y.; Chapmann, J.N.

    In: Journal of magnetism and magnetic materials, Vol. 0, No. 113, 1992, p. 21-28.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Microstructure and Magnetic Properties of Very Thin CoCr Films Deposited on Different Underlayers by rf-Sputtering

    AU - Pan, G.

    AU - Mapps, D.J.

    AU - Akhter, M.A.

    AU - Lodder, J.C.

    AU - ten Berge, P.

    AU - ten Berge, P.

    AU - Wong, H.Y.

    AU - Chapmann, J.N.

    N1 - Imported from SMI Reference manager

    PY - 1992

    Y1 - 1992

    N2 - Very thin CoCr films deposited on different underlayers on glass disk substrates were studied by the magneto-optic Kerr effect, VSM, torque magnetometry and TEM selected area diffraction. Square or near square perpendicular loops were obtained from Co/Ti, CoCr/Au, CoCr/Al, CoCr/C and CoCr/Si films. TEM SAD study revealed that the crystalline structure is a key factor determining the magnetic anisotropy of the very thin CoCr films. In particular, the c-axis of the hep CoCr films which exhibit square perpendicular loops is perpendicular to the film plane whilst that of the CoCr films which exhibit a thin and flat perpendicular loop lies in the film plane. The texture of the very thin CoCr films deposited on different underlayers is mainly dependent on the structure and texture of underlayers. The relation between the structure of CoCr and its underlayers is discussed.

    AB - Very thin CoCr films deposited on different underlayers on glass disk substrates were studied by the magneto-optic Kerr effect, VSM, torque magnetometry and TEM selected area diffraction. Square or near square perpendicular loops were obtained from Co/Ti, CoCr/Au, CoCr/Al, CoCr/C and CoCr/Si films. TEM SAD study revealed that the crystalline structure is a key factor determining the magnetic anisotropy of the very thin CoCr films. In particular, the c-axis of the hep CoCr films which exhibit square perpendicular loops is perpendicular to the film plane whilst that of the CoCr films which exhibit a thin and flat perpendicular loop lies in the film plane. The texture of the very thin CoCr films deposited on different underlayers is mainly dependent on the structure and texture of underlayers. The relation between the structure of CoCr and its underlayers is discussed.

    KW - EWI-5608

    KW - SMI-TST: From 2006 in EWI-TST

    KW - METIS-129088

    KW - IR-24288

    KW - SMI-MAT: MATERIALS

    U2 - 10.1016/0304-8853(92)91242-L

    DO - 10.1016/0304-8853(92)91242-L

    M3 - Article

    VL - 0

    SP - 21

    EP - 28

    JO - Journal of magnetism and magnetic materials

    JF - Journal of magnetism and magnetic materials

    SN - 0304-8853

    IS - 113

    ER -