Microsystem Testing: Challenge or Common Knowledge

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Title of host publicationAsian Test Symposium (ATS'98)
    Place of PublicationSingapore
    Pages510-512
    Number of pages3
    Publication statusPublished - 4 Dec 1998

    Keywords

    • METIS-112985

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