| Original language | Undefined |
|---|---|
| Title of host publication | Asian Test Symposium (ATS'98) |
| Place of Publication | Singapore |
| Pages | 510-512 |
| Number of pages | 3 |
| Publication status | Published - 4 Dec 1998 |
Keywords
- METIS-112985
Microsystem Testing: Challenge or Common Knowledge
Hans G. Kerkhoff
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
1
Citation
(Scopus)