@inproceedings{84d2e99f5c294fe5801e028c7b4608c9,
title = "MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation",
abstract = "This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer",
keywords = "METIS-112955, IR-16071",
author = "Kerkhoff, {Hans G.} and R.J.W.T. Tangelder and Han Speek and N. Engin",
year = "1996",
month = may,
day = "15",
doi = "10.1109/ICECS.1996.584606",
language = "Undefined",
publisher = "IEEE",
pages = "75--80",
booktitle = "Proceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96)",
address = "United States",
note = "Third IEEE International Electronics, Circuits, and Systems, ICECS '96 ; Conference date: 13-10-1996 Through 16-10-1996",
}