MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation

Hans G. Kerkhoff; R.J.W.T. Tangelder; Han Speek; N. Engin

doi:10.1109/ICECS.1996.584606

MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation

Hans G. Kerkhoff, R.J.W.T. Tangelder, Han Speek, N. Engin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

133 Downloads (Pure)

Abstract

This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer

Original language	Undefined
Title of host publication	Proceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96)
Place of Publication	Quebec City, Canada
Publisher	IEEE
Pages	75-80
DOIs	https://doi.org/10.1109/ICECS.1996.584606
Publication status	Published - 15 May 1996
Event	Third IEEE International Electronics, Circuits, and Systems, ICECS '96 - Rodos, Greece Duration: 13 Oct 1996 → 16 Oct 1996

Publication series

Name
Publisher	IEEE
Volume	2

Conference

Conference	Third IEEE International Electronics, Circuits, and Systems, ICECS '96
Period	13/10/96 → 16/10/96
Other	13-16 Oct. 1996

Keywords

METIS-112955
IR-16071

Access to Document

10.1109/ICECS.1996.584606

00584606

Cite this

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title = "MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation",

abstract = "This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer",

keywords = "METIS-112955, IR-16071",

author = "Kerkhoff, {Hans G.} and R.J.W.T. Tangelder and Han Speek and N. Engin",

year = "1996",

month = may,

day = "15",

doi = "10.1109/ICECS.1996.584606",

language = "Undefined",

publisher = "IEEE",

pages = "75--80",

booktitle = "Proceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96)",

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note = "Third IEEE International Electronics, Circuits, and Systems, ICECS '96 ; Conference date: 13-10-1996 Through 16-10-1996",

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Kerkhoff, HG, Tangelder, RJWT, Speek, H & Engin, N 1996, MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation. in Proceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96). IEEE, Quebec City, Canada, pp. 75-80, Third IEEE International Electronics, Circuits, and Systems, ICECS '96, 13/10/96. https://doi.org/10.1109/ICECS.1996.584606

MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation. / Kerkhoff, Hans G.; Tangelder, R.J.W.T.; Speek, Han et al.
Proceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96). Quebec City, Canada: IEEE, 1996. p. 75-80.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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PY - 1996/5/15

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