MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation

Hans G. Kerkhoff, R.J.W.T. Tangelder, Han Speek, N. Engin

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    Abstract

    This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer
    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96)
    Place of PublicationQuebec City, Canada
    PublisherIEEE
    Pages75-80
    DOIs
    Publication statusPublished - 15 May 1996
    EventThird IEEE International Electronics, Circuits, and Systems, ICECS '96 - Rodos, Greece
    Duration: 13 Oct 199616 Oct 1996

    Publication series

    Name
    PublisherIEEE
    Volume2

    Conference

    ConferenceThird IEEE International Electronics, Circuits, and Systems, ICECS '96
    Period13/10/9616/10/96
    Other13-16 Oct. 1996

    Keywords

    • METIS-112955
    • IR-16071

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