MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff; G. Docherty

doi:10.1109/ATS.1993.398785

MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff, G. Docherty

Research output: Contribution to conference › Paper

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Abstract

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

Original language	Undefined
Pages	88-93
DOIs	https://doi.org/10.1109/ATS.1993.398785
Publication status	Published - 1993
Event	Second Asian Test Symposium, ATS 1993 - Beijing, China Duration: 16 Nov 1993 → 18 Nov 1993

Conference

Conference	Second Asian Test Symposium, ATS 1993
Period	16/11/93 → 18/11/93
Other	November 16-18, 1993

Keywords

IR-56059

Access to Document

10.1109/ATS.1993.398785

00398785

Cite this

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title = "MISSED: an environment for mixed-signal microsystem testing and diagnosis",

abstract = "A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging",

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