MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff, G. Docherty

Research output: Contribution to conferencePaperAcademic

38 Downloads (Pure)

Abstract

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging
Original languageUndefined
Pages88-93
DOIs
Publication statusPublished - 1993

Keywords

  • IR-56059

Cite this

@conference{56dc24697b544c3abc17b802929848ec,
title = "MISSED: an environment for mixed-signal microsystem testing and diagnosis",
abstract = "A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging",
keywords = "IR-56059",
author = "Kerkhoff, {Hans G.} and G. Docherty",
year = "1993",
doi = "10.1109/ATS.1993.398785",
language = "Undefined",
pages = "88--93",

}

MISSED: an environment for mixed-signal microsystem testing and diagnosis. / Kerkhoff, Hans G.; Docherty, G.

1993. 88-93.

Research output: Contribution to conferencePaperAcademic

TY - CONF

T1 - MISSED: an environment for mixed-signal microsystem testing and diagnosis

AU - Kerkhoff, Hans G.

AU - Docherty, G.

PY - 1993

Y1 - 1993

N2 - A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

AB - A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

KW - IR-56059

U2 - 10.1109/ATS.1993.398785

DO - 10.1109/ATS.1993.398785

M3 - Paper

SP - 88

EP - 93

ER -