MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff, G. Docherty

    Research output: Contribution to conferencePaperAcademic

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    Abstract

    A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging
    Original languageUndefined
    Pages88-93
    DOIs
    Publication statusPublished - 1993
    EventSecond Asian Test Symposium, ATS 1993 - Beijing, China
    Duration: 16 Nov 199318 Nov 1993

    Conference

    ConferenceSecond Asian Test Symposium, ATS 1993
    Period16/11/9318/11/93
    OtherNovember 16-18, 1993

    Keywords

    • IR-56059

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