MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff; G. Docherty

doi:10.1109/ATS.1993.398785

MISSED: an environment for mixed-signal microsystem testing and diagnosis

Hans G. Kerkhoff
, G. Docherty

Research output: Contribution to conference › Paper

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Abstract

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

Original language	Undefined
Pages	88-93
DOIs	https://doi.org/10.1109/ATS.1993.398785
Publication status	Published - 1993
Event	Second Asian Test Symposium, ATS 1993 - Beijing, China Duration: 16 Nov 1993 → 18 Nov 1993

Conference

Conference	Second Asian Test Symposium, ATS 1993
Period	16/11/93 → 18/11/93
Other	November 16-18, 1993

Keywords

IR-56059

Access to Document

10.1109/ATS.1993.398785

00398785

Cite this

@conference{56dc24697b544c3abc17b802929848ec,

title = "MISSED: an environment for mixed-signal microsystem testing and diagnosis",

abstract = "A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging",

keywords = "IR-56059",

author = "Kerkhoff, \{Hans G.\} and G. Docherty",

year = "1993",

doi = "10.1109/ATS.1993.398785",

language = "Undefined",

pages = "88--93",

note = "Second Asian Test Symposium, ATS 1993 ; Conference date: 16-11-1993 Through 18-11-1993",

}

TY - CONF

T1 - MISSED: an environment for mixed-signal microsystem testing and diagnosis

AU - Kerkhoff, Hans G.

AU - Docherty, G.

PY - 1993

Y1 - 1993

N2 - A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

AB - A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

KW - IR-56059

U2 - 10.1109/ATS.1993.398785

DO - 10.1109/ATS.1993.398785

M3 - Paper

SP - 88

EP - 93

T2 - Second Asian Test Symposium, ATS 1993

Y2 - 16 November 1993 through 18 November 1993

ER -