Missing dimer defects investigated by adsorption of nitric oxide (NO) on silicon (100) 2 × 1

A.G.B.M. Sasse, P.M. Kleinherenbrink, Arend van Silfhout

    Research output: Contribution to journalArticleAcademic

    9 Citations (Scopus)
    80 Downloads (Pure)

    Abstract

    This paper describes a study concerning the interaction of nitric oxide (NO) with the clean Si(100)2×1 surface in ultra-high vacuum at room temperature. Differential reflectometry (DR) in the photon energy range of 2.4–4.4 eV. Auger electron spectroscopy (AES) and low energy electron diffraction (LEED) have been used to investigate the chemisorption of NO on Si(100)2×1. With this combination of techniques it is possible to make an analysis of the geometric and electronic structure and chemical composition of the surface layer. The aim of the present study was to explain the experimental results of the adsorption of NO on the clean Si(100)2×1 at 300 K. Analysing the electronic and geometric structure of a simplified stepped 2×1 reconstructed Si(100) surface and of the NO molecule in combination with the use of Woodward-Hoffmann rules (WHR) we were able to model a surface defect specific adsorption mechanism. Surface defects such as missing dimer defects seem to play an important role in the adsorption mechanism of NO on the silicon surface. The experimental results are consistent with this developed model. We also suggest a relation between the missing dimer defects and the number of steps on the silicon surface.
    Original languageUndefined
    Pages (from-to)243-260
    JournalSurface science
    Volume199
    Issue number1-2
    DOIs
    Publication statusPublished - 1988

    Keywords

    • IR-70045

    Cite this