Mixed-Signal Testability Analysis for Data-Converter IPs

Araldo van de Kraats, Hans G. Kerkhoff

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    Abstract

    In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.
    Original languageUndefined
    Title of host publicationProceedings ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing
    Place of PublicationUtrecht, The Netherlands
    PublisherSTW
    Pages1-6
    Number of pages6
    ISBN (Print)90-73461-50-2
    Publication statusPublished - 2005
    Event16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005 - Veldhoven, Netherlands
    Duration: 17 Nov 200518 Nov 2005
    Conference number: 16

    Publication series

    Name
    PublisherSTW Technology Foundation

    Workshop

    Workshop16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005
    CountryNetherlands
    CityVeldhoven
    Period17/11/0518/11/05

    Keywords

    • METIS-226939
    • EWI-20039
    • IR-59555

    Cite this

    van de Kraats, A., & Kerkhoff, H. G. (2005). Mixed-Signal Testability Analysis for Data-Converter IPs. In Proceedings ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing (pp. 1-6). Utrecht, The Netherlands: STW.