Mixed-Signal testing at the ASIC design course at Twente University

R.J.W.T. Tangelder, Hendrikus de Vries, Eric A.M. Klumperink, H. Snijders, Hans G. Kerkhoff, Jaap Smit, Sabih H. Gerez, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 3rd European Workshop on Microelectronics Education
    Place of PublicationFuveau - France
    Pages205-208
    Publication statusPublished - 27 Jan 2000

    Keywords

    • METIS-113021

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