Mixed-Signal testing at the ASIC design course at Twente University

R.J.W.T. Tangelder; H. de Vries; E.A.M. Klumperink; H. Snijders; H.G. Kerkhoff; J. Smit; S.H. Gerez; H. Speek

doi:10.1007/978-94-015-9506-3

Mixed-Signal testing at the ASIC design course at Twente University

R.J.W.T. Tangelder, H. de Vries, E.A.M. Klumperink, H. Snijders, H.G. Kerkhoff, J. Smit, S.H. Gerez, H. Speek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

At our faculty the students have to follow an extensive (mixed-signal) ASIC design course in the third year of the program. In [1] we have presented an overview of the whole course, but in the meanwhile we have extended the mixed-signal test part of this ASIC design course considerably. In our course the students have to design and test a so-called dial-memo IC.

Original language	English
Title of host publication	Microelectronics Education
Subtitle of host publication	Proceedings of the 3rd European Workshop on Microelectronics Education
Editors	B. Courtois, N. Guillemot, G. Kamarinos, G. Stéhelin
Place of Publication	Dordrecht
Publisher	Springer
Pages	205-208
ISBN (Electronic)	978-94-015-9506-3
ISBN (Print)	978-0-7923-6456-6, 978-90-481-5518-7
DOIs	https://doi.org/10.1007/978-94-015-9506-3
Publication status	Published - 27 Jan 2000

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The Mixed-Signal ASIC design course at Twente
Tangelder, R. J. W. T., Gerez, S. H., Kerkhoff, H. G., Klumperink, E. A. M., Smit, J., Snijders, H., Speek, H. & de Vries, H., 27 Jan 2000. 4 p.
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Tangelder, R. J. W. T., de Vries, H., Klumperink, E. A. M., Snijders, H., Kerkhoff, H. G., Smit, J., Gerez, S. H., & Speek, H. (2000). Mixed-Signal testing at the ASIC design course at Twente University. In B. Courtois, N. Guillemot, G. Kamarinos, & G. Stéhelin (Eds.), Microelectronics Education: Proceedings of the 3rd European Workshop on Microelectronics Education (pp. 205-208). Springer. https://doi.org/10.1007/978-94-015-9506-3

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abstract = "At our faculty the students have to follow an extensive (mixed-signal) ASIC design course in the third year of the program. In [1] we have presented an overview of the whole course, but in the meanwhile we have extended the mixed-signal test part of this ASIC design course considerably. In our course the students have to design and test a so-called dial-memo IC.",

author = "R.J.W.T. Tangelder and {de Vries}, H. and E.A.M. Klumperink and H. Snijders and H.G. Kerkhoff and J. Smit and S.H. Gerez and H. Speek",

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Tangelder, RJWT, de Vries, H, Klumperink, EAM, Snijders, H, Kerkhoff, HG, Smit, J, Gerez, SH & Speek, H 2000, Mixed-Signal testing at the ASIC design course at Twente University. in B Courtois, N Guillemot, G Kamarinos & G Stéhelin (eds), Microelectronics Education: Proceedings of the 3rd European Workshop on Microelectronics Education. Springer, Dordrecht, pp. 205-208. https://doi.org/10.1007/978-94-015-9506-3

Mixed-Signal testing at the ASIC design course at Twente University. / Tangelder, R.J.W.T.; de Vries, H.; Klumperink, E.A.M. et al.
Microelectronics Education: Proceedings of the 3rd European Workshop on Microelectronics Education. ed. / B. Courtois; N. Guillemot; G. Kamarinos; G. Stéhelin. Dordrecht: Springer, 2000. p. 205-208.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Kerkhoff, H.G.

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AU - Speek, H.

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N2 - At our faculty the students have to follow an extensive (mixed-signal) ASIC design course in the third year of the program. In [1] we have presented an overview of the whole course, but in the meanwhile we have extended the mixed-signal test part of this ASIC design course considerably. In our course the students have to design and test a so-called dial-memo IC.

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Tangelder RJWT, de Vries H, Klumperink EAM, Snijders H, Kerkhoff HG, Smit J et al. Mixed-Signal testing at the ASIC design course at Twente University. In Courtois B, Guillemot N, Kamarinos G, Stéhelin G, editors, Microelectronics Education: Proceedings of the 3rd European Workshop on Microelectronics Education. Dordrecht: Springer. 2000. p. 205-208 doi: 10.1007/978-94-015-9506-3

Mixed-Signal testing at the ASIC design course at Twente University

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The Mixed-Signal ASIC design course at Twente

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