| Original language | English |
|---|---|
| Title of host publication | IEEE International Mixed-Signal Testing Workshop |
| Place of Publication | Whistler, Canada |
| Pages | 339-344 |
| Number of pages | 6 |
| Publication status | Published - 1 Jun 1999 |
Mixed-Signal Testing in a Microsystem Environment
Hans G. Kerkhoff
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review