Mixed-Signal Testing in a Microsystem Environment

Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationIEEE International Mixed-Signal Testing Workshop
    Place of PublicationWhistler, Canada
    Pages339-344
    Number of pages6
    Publication statusPublished - 1 Jun 1999

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