Mixed-Signal Testing in a Microsystem Environment

Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Original languageUndefined
    Title of host publicationIEEE International Mixed-Signal Testing Workshop
    Place of PublicationWhistler, Canada
    Pages339-344
    Number of pages6
    Publication statusPublished - 1 Jun 1999

    Keywords

    • METIS-113037

    Cite this

    Kerkhoff, H. G. (1999). Mixed-Signal Testing in a Microsystem Environment. In IEEE International Mixed-Signal Testing Workshop (pp. 339-344). Whistler, Canada.