Mixed-Signal Testing in a Silicon-based MCM

Hans G. Kerkhoff, G. Boom, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of 3rd International Mixed-Signal Testing Workshop
    Place of PublicationSeattle
    Pages195-197
    Number of pages3
    Publication statusPublished - 1 Jun 1997

    Keywords

    • METIS-112940

    Cite this

    Kerkhoff, H. G., Boom, G., & Speek, H. (1997). Mixed-Signal Testing in a Silicon-based MCM. In Proceedings of 3rd International Mixed-Signal Testing Workshop (pp. 195-197). Seattle.