Mixed-Signal Testing in a Silicon-based MCM

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of 3rd International Mixed-Signal Testing Workshop
Place of Publication	Seattle
Pages	195-197
Number of pages	3
Publication status	Published - 1 Jun 1997

Keywords

@inproceedings{2bfeaf6a21364bdabb2a7768d6110713,

title = "Mixed-Signal Testing in a Silicon-based MCM",

keywords = "METIS-112940",

author = "Kerkhoff, \{Hans G.\} and G. Boom and H. Speek",

year = "1997",

month = jun,

day = "1",

language = "Undefined",

pages = "195--197",

booktitle = "Proceedings of 3rd International Mixed-Signal Testing Workshop",

}