Mixed-Signal Testing in MCM-D Microsystems

Hans G. Kerkhoff, G. Boom, H. Speek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{f8c95ff0bde14d20954e27924d20aea1,

title = "Mixed-Signal Testing in MCM-D Microsystems",

keywords = "METIS-112946",

author = "Kerkhoff, {Hans G.} and G. Boom and H. Speek",

year = "1997",

month = jan,

day = "20",

language = "Undefined",

isbn = "90-73461-12-X",

pages = "263--268",

booktitle = "Proceedings of IEEE CSSP97",

}