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Mixed-Signal Testing in MCM-D Microsystems

  • Hans G. Kerkhoff
  • , G. Boom
  • , H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of IEEE CSSP97
    Pages263-268
    Number of pages5
    Publication statusPublished - 20 Jan 1997

    Keywords

    • METIS-112946

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