Modeling and experimental verification of the dynamic interaction of an AFM-tip with a photonic crystal microcavity

W.C.L. Hopman, Kees van der Werf, Anton Hollink, Wim Bogaerts, Vinod Subramaniam, R.M. de Ridder

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We present a transmission model for estimating the effect of the atomic-force microscopy tapping tip height on a photonic crystal microcavity (MC). This model uses a fit of the measured tip-height-dependent transmission above a “hot spot��? in the MC. The predicted transmission versus average tapping height is in good agreement with the values obtained from tapping mode experiments. Furthermore, we show that for the existing, nonoptimized structure, the transmission coefficient can be tuned between 0.32 and 0.8 by varying the average tapping height from 26 to 265 nm. A transmission larger than that of the undisturbed cavity at resonance was observed at specific tip locations just outside the cavity-terminating holes.
Original languageUndefined
Article number10.1109/LPT.2007.911519
Pages (from-to)57-59
Number of pages3
JournalIEEE photonics technology letters
Issue number1
Publication statusPublished - 1 Jan 2008


  • EWI-12807
  • Integrated Optics
  • near-field microscopy
  • optical microcavities (MCs)
  • Modeling
  • Photonic crystal (PhC)
  • METIS-241375
  • IR-64790
  • Atomic force microscopy (AFM)
  • optical variables measurement

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