Modeling damage in large and heavy electronic components due to dynamic loading

Ed Habtour*, Gary S. Drake, Christopher Davies

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Modeling damage in large and heavy electronic components due to dynamic loading'. Together they form a unique fingerprint.

Engineering & Materials Science

Mathematics