Modeling DMOS transistors under high injection conditions

G. Boselli, A.J. Mouthaan, F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationSAFE Proceedings 1999
    Place of PublicationMierlo, The Netherlands
    Pages55-61
    Number of pages7
    Publication statusPublished - 24 Nov 1999

    Keywords

    • METIS-113965

    Cite this

    Boselli, G., Mouthaan, A. J., & Kuper, F. G. (1999). Modeling DMOS transistors under high injection conditions. In SAFE Proceedings 1999 (pp. 55-61). Mierlo, The Netherlands.