Modeling DMOS transistors under high injection conditions

  • G. Boselli
  • , A.J. Mouthaan
  • , F.G. Kuper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationSAFE Proceedings 1999
    Place of PublicationMierlo, The Netherlands
    Pages55-61
    Number of pages7
    Publication statusPublished - 24 Nov 1999

    Keywords

    • METIS-113965

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