Modeling QCA defects at molecular-level in combinational circuits

M. Momenzadeh, M. Ottavi, F. Lombardi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

96 Citations (Scopus)

Abstract

This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate, i.e. no cell, or an additional cell is placed either near, or within the layout configuration of a QCA device. The effects of an erroneous cell deposition defect are analyzed by considering the induced functional faults for different QCA devices, such as the majority voter, the inverter and various wire configurations (straight, L-shape, coplanar crossing and fanout). Extensive simulation results are provided. As an example, testing of an EXOR circuit is analyzed in detail.
Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Pages208-216
DOIs
Publication statusPublished - 2005
Externally publishedYes
Event20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005 - Monterey, United States
Duration: 3 Oct 20055 Oct 2005
Conference number: 20

Conference

Conference20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005
Abbreviated titleDFT 2005
Country/TerritoryUnited States
CityMonterey
Period3/10/055/10/05

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