Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses

Igor Milov, Igor A. Makhotkin (Contributor), Ryszard Sobierajski (Contributor), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D Ilnisky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), V.V. Medvedev (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)

Research output: Contribution to conferencePosterAcademic

Abstract

Survivability of optical elements exposed to high doses of XUV laser radiation is an important issue in the context of rapidly developing x-ray free-electron laser (XFEL) light sources. In order to prevent optics from being damaged, the fundamental mechanisms governing the material response to ultrashort high peak power XFEL pulses must be identified and studied.
We present computational study of the interaction of femtosecond XUV (13.5 nm wavelength) laser pulses with 50 nm thin Ru films. With our calculations we model the damage experiments that was performed at Free-Electron LASer in Hamburg (FLASH) [1]–[3]. Ru is chosen as optically favorable material for grazing incidence reflective mirrors.
The performed simulations consist of two parts. First, the effect of electron cascading induced after absorption of XUV photons is studied using an event-by-event Monte Carlo code XCASCADE [4]. Time of cascading and ballistic range of non-thermalized electrons are calculated. Second, the evolution of electron and lattice temperatures in the regime of thermal non-equilibrium together with atomic motion in irradiated Ru are modeled with a combination of two temperature hydrodynamics [5] and molecular dynamics [6]. Our calculations showed that the mechanism responsible for the ablation of Ru observed in the experiment is spallation in the stress confinement regime. The processes of melting, cavitation, spallation and recrystallization are modeled. The results show good agreement with the experimental observations.

Conference

Conference4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018
Abbreviated titlePhotonDiag 2018
CountryGermany
CityHamburg
Period17/09/1819/09/18
Internet address

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x ray lasers
spallation
free electron lasers
ballistic ranges
damage
thin films
cavitation flow
pulses
grazing incidence
free electrons
ablation
lasers
light sources
electrons
hydrodynamics
melting
laser beams
optics
electron energy
mirrors

Cite this

Milov, I., Makhotkin, I. A., Sobierajski, R., Medvedev, N., lipp, V., Ziaja, B., ... Bijkerk, F. (2018). Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018, Hamburg, Germany.
Milov, Igor ; Makhotkin, Igor A. ; Sobierajski, Ryszard ; Medvedev, Nikita ; lipp, vladimir ; Ziaja, B. ; Khokhlov, V. ; Zhakhovsky, V. ; Petrov, Yu. ; Shepelev, V. ; Ilnisky, D ; Migdal, K. ; Inogamov, N. ; Medvedev, V.V. ; Louis, Eric ; Bijkerk, F. / Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018, Hamburg, Germany.
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title = "Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses",
abstract = "Survivability of optical elements exposed to high doses of XUV laser radiation is an important issue in the context of rapidly developing x-ray free-electron laser (XFEL) light sources. In order to prevent optics from being damaged, the fundamental mechanisms governing the material response to ultrashort high peak power XFEL pulses must be identified and studied. We present computational study of the interaction of femtosecond XUV (13.5 nm wavelength) laser pulses with 50 nm thin Ru films. With our calculations we model the damage experiments that was performed at Free-Electron LASer in Hamburg (FLASH) [1]–[3]. Ru is chosen as optically favorable material for grazing incidence reflective mirrors.The performed simulations consist of two parts. First, the effect of electron cascading induced after absorption of XUV photons is studied using an event-by-event Monte Carlo code XCASCADE [4]. Time of cascading and ballistic range of non-thermalized electrons are calculated. Second, the evolution of electron and lattice temperatures in the regime of thermal non-equilibrium together with atomic motion in irradiated Ru are modeled with a combination of two temperature hydrodynamics [5] and molecular dynamics [6]. Our calculations showed that the mechanism responsible for the ablation of Ru observed in the experiment is spallation in the stress confinement regime. The processes of melting, cavitation, spallation and recrystallization are modeled. The results show good agreement with the experimental observations.",
author = "Igor Milov and Makhotkin, {Igor A.} and Ryszard Sobierajski and Nikita Medvedev and vladimir lipp and B. Ziaja and V. Khokhlov and V. Zhakhovsky and Yu. Petrov and V. Shepelev and D Ilnisky and K. Migdal and N. Inogamov and V.V. Medvedev and Eric Louis and F. Bijkerk",
year = "2018",
month = "9",
day = "17",
language = "English",
note = "4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018 : Workshop on FEL Photon Diagnostics, Instrumentation, and Beamliness Design, PhotonDiag 2018 ; Conference date: 17-09-2018 Through 19-09-2018",
url = "https://lightsources.org/event/photondiag-2018-workshop-on-fel-photon-diagnostics-instrumentation-and-beamlines-design/",

}

Milov, I, Makhotkin, IA, Sobierajski, R, Medvedev, N, lipp, V, Ziaja, B, Khokhlov, V, Zhakhovsky, V, Petrov, Y, Shepelev, V, Ilnisky, D, Migdal, K, Inogamov, N, Medvedev, VV, Louis, E & Bijkerk, F 2018, 'Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses' 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018, Hamburg, Germany, 17/09/18 - 19/09/18, .

Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses. / Milov, Igor ; Makhotkin, Igor A. (Contributor); Sobierajski, Ryszard (Contributor); Medvedev, Nikita (Contributor); lipp, vladimir (Contributor); Ziaja, B. (Contributor); Khokhlov, V. (Contributor); Zhakhovsky, V. (Contributor); Petrov, Yu. (Contributor); Shepelev, V. (Contributor); Ilnisky, D (Contributor); Migdal, K. (Contributor); Inogamov, N. (Contributor); Medvedev, V.V. (Contributor); Louis, Eric (Contributor); Bijkerk, F. (Contributor).

2018. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018, Hamburg, Germany.

Research output: Contribution to conferencePosterAcademic

TY - CONF

T1 - Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses

AU - Milov, Igor

A2 - Makhotkin, Igor A.

A2 - Sobierajski, Ryszard

A2 - Medvedev, Nikita

A2 - lipp, vladimir

A2 - Ziaja, B.

A2 - Khokhlov, V.

A2 - Zhakhovsky, V.

A2 - Petrov, Yu.

A2 - Shepelev, V.

A2 - Ilnisky, D

A2 - Migdal, K.

A2 - Inogamov, N.

A2 - Medvedev, V.V.

A2 - Louis, Eric

A2 - Bijkerk, F.

PY - 2018/9/17

Y1 - 2018/9/17

N2 - Survivability of optical elements exposed to high doses of XUV laser radiation is an important issue in the context of rapidly developing x-ray free-electron laser (XFEL) light sources. In order to prevent optics from being damaged, the fundamental mechanisms governing the material response to ultrashort high peak power XFEL pulses must be identified and studied. We present computational study of the interaction of femtosecond XUV (13.5 nm wavelength) laser pulses with 50 nm thin Ru films. With our calculations we model the damage experiments that was performed at Free-Electron LASer in Hamburg (FLASH) [1]–[3]. Ru is chosen as optically favorable material for grazing incidence reflective mirrors.The performed simulations consist of two parts. First, the effect of electron cascading induced after absorption of XUV photons is studied using an event-by-event Monte Carlo code XCASCADE [4]. Time of cascading and ballistic range of non-thermalized electrons are calculated. Second, the evolution of electron and lattice temperatures in the regime of thermal non-equilibrium together with atomic motion in irradiated Ru are modeled with a combination of two temperature hydrodynamics [5] and molecular dynamics [6]. Our calculations showed that the mechanism responsible for the ablation of Ru observed in the experiment is spallation in the stress confinement regime. The processes of melting, cavitation, spallation and recrystallization are modeled. The results show good agreement with the experimental observations.

AB - Survivability of optical elements exposed to high doses of XUV laser radiation is an important issue in the context of rapidly developing x-ray free-electron laser (XFEL) light sources. In order to prevent optics from being damaged, the fundamental mechanisms governing the material response to ultrashort high peak power XFEL pulses must be identified and studied. We present computational study of the interaction of femtosecond XUV (13.5 nm wavelength) laser pulses with 50 nm thin Ru films. With our calculations we model the damage experiments that was performed at Free-Electron LASer in Hamburg (FLASH) [1]–[3]. Ru is chosen as optically favorable material for grazing incidence reflective mirrors.The performed simulations consist of two parts. First, the effect of electron cascading induced after absorption of XUV photons is studied using an event-by-event Monte Carlo code XCASCADE [4]. Time of cascading and ballistic range of non-thermalized electrons are calculated. Second, the evolution of electron and lattice temperatures in the regime of thermal non-equilibrium together with atomic motion in irradiated Ru are modeled with a combination of two temperature hydrodynamics [5] and molecular dynamics [6]. Our calculations showed that the mechanism responsible for the ablation of Ru observed in the experiment is spallation in the stress confinement regime. The processes of melting, cavitation, spallation and recrystallization are modeled. The results show good agreement with the experimental observations.

M3 - Poster

ER -

Milov I, Makhotkin IA, Sobierajski R, Medvedev N, lipp V, Ziaja B et al. Modelling of damage in Ru thin films induced by femtosecond XUV laser pulses. 2018. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design 2018, Hamburg, Germany.