Monitoring operating temperature and supply voltage in achieving high system dependability

M.A. Khan; Hans G. Kerkhoff

doi:10.1109/DTIS.2013.6527788

Monitoring operating temperature and supply voltage in achieving high system dependability

M.A. Khan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

106 Downloads (Pure)

Abstract

System dependability being a set of number of attributes, of which the important reliability, heavily depends on operating temperature and supply voltage. Any change beyond the designed specifications may change the system performance and could result in system reliability and hence dependability problems. These reliability problems could be short-term variations and can be solved if the system returns back to its normal operational temperature and supply voltage. Therefore, these reliability problems should be differentiated from the other long-term reliability problems resulting from aging mechanisms. These are a function of stress time and have a cumulative nature. This differentiation is essential to better manage the system dependability during its operational life. This separation of two reliability problems requires a regular monitoring of the system operating temperature and the supply voltage during its operational life. The problem has been solved in the proposed hardware architecture and workflow that takes this monitoring into account to tackle them separately and carries out proper actions in order to enhance the system dependability. The simulation results for a target system carried out in LabVIEW environment fully support the proposed idea.

Original language	Undefined
Title of host publication	8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013
Place of Publication	USA
Publisher	IEEE
Pages	108-112
Number of pages	5
ISBN (Print)	978-1-4673-6039-5
DOIs	https://doi.org/10.1109/DTIS.2013.6527788
Publication status	Published - 26 Mar 2013
Event	8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013 - Abu Dhabi, United Arab Emirates Duration: 26 Mar 2013 → 28 Mar 2013 Conference number: 8

Publication series

Name
Publisher	IEEE

Conference

Conference	8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013
Abbreviated title	DTIS
Country/Territory	United Arab Emirates
City	Abu Dhabi
Period	26/03/13 → 28/03/13

Keywords

self-calibration
self-diagnosis
EWI-23838
CAES-TDT: Testable Design and Test
IR-87490
redundancy
Reliability
METIS-300087
system dependability

Access to Document

10.1109/DTIS.2013.6527788

06527788

Cite this

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title = "Monitoring operating temperature and supply voltage in achieving high system dependability",

abstract = "System dependability being a set of number of attributes, of which the important reliability, heavily depends on operating temperature and supply voltage. Any change beyond the designed specifications may change the system performance and could result in system reliability and hence dependability problems. These reliability problems could be short-term variations and can be solved if the system returns back to its normal operational temperature and supply voltage. Therefore, these reliability problems should be differentiated from the other long-term reliability problems resulting from aging mechanisms. These are a function of stress time and have a cumulative nature. This differentiation is essential to better manage the system dependability during its operational life. This separation of two reliability problems requires a regular monitoring of the system operating temperature and the supply voltage during its operational life. The problem has been solved in the proposed hardware architecture and workflow that takes this monitoring into account to tackle them separately and carries out proper actions in order to enhance the system dependability. The simulation results for a target system carried out in LabVIEW environment fully support the proposed idea.",

keywords = "self-calibration, self-diagnosis, EWI-23838, CAES-TDT: Testable Design and Test, IR-87490, redundancy, Reliability, METIS-300087, system dependability",

author = "M.A. Khan and Kerkhoff, {Hans G.}",

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year = "2013",

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doi = "10.1109/DTIS.2013.6527788",

language = "Undefined",

isbn = "978-1-4673-6039-5",

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Khan, MA & Kerkhoff, HG 2013, Monitoring operating temperature and supply voltage in achieving high system dependability. in 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013. IEEE, USA, pp. 108-112, 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, Abu Dhabi, United Arab Emirates, 26/03/13. https://doi.org/10.1109/DTIS.2013.6527788

Monitoring operating temperature and supply voltage in achieving high system dependability. / Khan, M.A.; Kerkhoff, Hans G.
8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013. USA: IEEE, 2013. p. 108-112.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Kerkhoff, Hans G.

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N2 - System dependability being a set of number of attributes, of which the important reliability, heavily depends on operating temperature and supply voltage. Any change beyond the designed specifications may change the system performance and could result in system reliability and hence dependability problems. These reliability problems could be short-term variations and can be solved if the system returns back to its normal operational temperature and supply voltage. Therefore, these reliability problems should be differentiated from the other long-term reliability problems resulting from aging mechanisms. These are a function of stress time and have a cumulative nature. This differentiation is essential to better manage the system dependability during its operational life. This separation of two reliability problems requires a regular monitoring of the system operating temperature and the supply voltage during its operational life. The problem has been solved in the proposed hardware architecture and workflow that takes this monitoring into account to tackle them separately and carries out proper actions in order to enhance the system dependability. The simulation results for a target system carried out in LabVIEW environment fully support the proposed idea.

AB - System dependability being a set of number of attributes, of which the important reliability, heavily depends on operating temperature and supply voltage. Any change beyond the designed specifications may change the system performance and could result in system reliability and hence dependability problems. These reliability problems could be short-term variations and can be solved if the system returns back to its normal operational temperature and supply voltage. Therefore, these reliability problems should be differentiated from the other long-term reliability problems resulting from aging mechanisms. These are a function of stress time and have a cumulative nature. This differentiation is essential to better manage the system dependability during its operational life. This separation of two reliability problems requires a regular monitoring of the system operating temperature and the supply voltage during its operational life. The problem has been solved in the proposed hardware architecture and workflow that takes this monitoring into account to tackle them separately and carries out proper actions in order to enhance the system dependability. The simulation results for a target system carried out in LabVIEW environment fully support the proposed idea.

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