Monitoring operating temperature and supply voltage in achieving high system dependability

M.A. Khan, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    56 Downloads (Pure)

    Abstract

    System dependability being a set of number of attributes, of which the important reliability, heavily depends on operating temperature and supply voltage. Any change beyond the designed specifications may change the system performance and could result in system reliability and hence dependability problems. These reliability problems could be short-term variations and can be solved if the system returns back to its normal operational temperature and supply voltage. Therefore, these reliability problems should be differentiated from the other long-term reliability problems resulting from aging mechanisms. These are a function of stress time and have a cumulative nature. This differentiation is essential to better manage the system dependability during its operational life. This separation of two reliability problems requires a regular monitoring of the system operating temperature and the supply voltage during its operational life. The problem has been solved in the proposed hardware architecture and workflow that takes this monitoring into account to tackle them separately and carries out proper actions in order to enhance the system dependability. The simulation results for a target system carried out in LabVIEW environment fully support the proposed idea.
    Original languageUndefined
    Title of host publication8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013
    Place of PublicationUSA
    PublisherIEEE
    Pages108-112
    Number of pages5
    ISBN (Print)978-1-4673-6039-5
    DOIs
    Publication statusPublished - 26 Mar 2013
    Event8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013: 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Abu Dhabi, UAE, USA
    Duration: 26 Mar 201328 Mar 2013

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013
    CityUSA
    Period26/03/1328/03/13
    Other26-28 March 2013

    Keywords

    • self-calibration
    • self-diagnosis
    • EWI-23838
    • CAES-TDT: Testable Design and Test
    • IR-87490
    • redundancy
    • Reliability
    • METIS-300087
    • system dependability

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