Monitoring oxide thin film growth with in-situ atomic force microscopy

Joska Johannes Broekmaat, F.J.G. Roesthuis, David H.A. Blank, Augustinus J.H.M. Rijnders

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 28 Sept 2006
Event	MESA+ Day 2006 - Cinestar, Enschede, Netherlands Duration: 28 Sept 2006 → 28 Sept 2006

Keywords

@conference{99b0d9b889364df884530d0491f046f4,

title = "Monitoring oxide thin film growth with in-situ atomic force microscopy",

keywords = "METIS-236624",

author = "Broekmaat, {Joska Johannes} and F.J.G. Roesthuis and Blank, {David H.A.} and Rijnders, {Augustinus J.H.M.}",

year = "2006",

month = sep,

day = "28",

language = "Undefined",

pages = "--",

note = "MESA+ Day 2006 ; Conference date: 28-09-2006 Through 28-09-2006",

}