Monitoring oxide thin film growth with in-situ atomic force microscopy

Joska Johannes Broekmaat, F.J.G. Roesthuis, David H.A. Blank, Augustinus J.H.M. Rijnders

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 28 Sep 2006
    EventMESA+ Day 2006 - Cinestar, Enschede, Netherlands
    Duration: 28 Sep 200628 Sep 2006

    Conference

    ConferenceMESA+ Day 2006
    CountryNetherlands
    CityEnschede
    Period28/09/0628/09/06
    Other(MESA+ Meeting/Dag)

    Keywords

    • METIS-236624

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