MOSFET Degradation Under RF Stress

G.T. Sasse, F.G. Kuper, Jurriaan Schmitz

    Research output: Contribution to journalArticleAcademicpeer-review

    38 Citations (Scopus)
    444 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'MOSFET Degradation Under RF Stress'. Together they form a unique fingerprint.

    Engineering & Materials Science

    Chemistry