MOSFET Degradation Under RF Stress

Research output

Research output per year 2009 2009 2009

• 44 Citations
• 1 Article

Research output per year

Research output per year

Search results

• 2009

  Corrections to “MOSFET Degradation Under RF Stress” (IEEE Transactions on Electron Devices (2009) 56(1) (157))

  Sasse, G. T., Kuper, F. G. & Schmitz, J., 2009, In: IEEE Transactions on Electron Devices.

  Research output: Contribution to journal › Article › Academic › peer-review
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