MOSFET hot-carrier degradation - Failure mechanisms and models for reliability circuit simulation

M.M. Lunenborg

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Verweij, J.F., Supervisor
    • Mouthaan, A.J., Advisor
    Award date18 Oct 1996
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9009761-9
    Publication statusPublished - 18 Oct 1996

    Keywords

    • METIS-111442

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