MOSFET hot-carrier degradation - Failure mechanisms and models for reliability circuit simulation

M.M. Lunenborg

Research output: Thesis › PhD Thesis - Research UT, graduation UT

Original language	Undefined
Awarding Institution	University of Twente
Supervisors/Advisors	Verweij, J.F., Supervisor Mouthaan, A.J., Advisor
Award date	18 Oct 1996
Place of Publication	Enschede
Publisher	Universiteit Twente
Print ISBNs	90-9009761-9
Publication status	Published - 18 Oct 1996

Cite this

@phdthesis{7e8aa30300b64027bba4088d58119445,

title = "MOSFET hot-carrier degradation - Failure mechanisms and models for reliability circuit simulation",

keywords = "METIS-111442",

author = "M.M. Lunenborg",

year = "1996",

month = "10",

day = "18",

language = "Undefined",

isbn = "90-9009761-9",

publisher = "Universiteit Twente",

school = "University of Twente",

}