Original language | English |
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Awarding Institution |
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Award date | 15 Apr 2005 |
Place of Publication | Enschede |
Publisher | |
Print ISBNs | 90-365-2173-4 |
Publication status | Published - 2005 |
MOSFET LF noise under large signal excitation: measurement, modelling and application
Arnoud Pieter van der Wel
Research output: Thesis › PhD Thesis - Research UT, graduation UT
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