MOSFETs on self-assembled SiGe dots with strain-enhanced mobility

V. Jovanović*, C. Biasotto, L. K. Nanver, J. Moers, D. Grützmacher, J. Gerharz, G. Mussler, J. Van Der Cingel, J. Zhang, G. Bauer, O. G. Schmidt, L. Miglio

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Fingerprint

Dive into the research topics of 'MOSFETs on self-assembled SiGe dots with strain-enhanced mobility'. Together they form a unique fingerprint.

Engineering