Multi-detection and polarization contrast in scanning near field optical microscopy in reflection

A. Jalocha, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Research output: Contribution to conferencePaperAcademicpeer-review

Original languageEnglish
Pages125-126
Number of pages2
Publication statusPublished - 26 Oct 1995
EventEOS Topical Meeting on Near Field Optics 1995 - Brno, Czech Republic
Duration: 9 May 199511 May 1995

Conference

ConferenceEOS Topical Meeting on Near Field Optics 1995
CountryCzech Republic
CityBrno
Period9/05/9511/05/95

Cite this

Jalocha, A., Moers, M. H. P., Ruiter, A. G. T., & van Hulst, N. F. (1995). Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. 125-126. Paper presented at EOS Topical Meeting on Near Field Optics 1995, Brno, Czech Republic.
Jalocha, A. ; Moers, M.H.P. ; Ruiter, A.G.T. ; van Hulst, N.F. / Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. Paper presented at EOS Topical Meeting on Near Field Optics 1995, Brno, Czech Republic.2 p.
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title = "Multi-detection and polarization contrast in scanning near field optical microscopy in reflection",
author = "A. Jalocha and M.H.P. Moers and A.G.T. Ruiter and {van Hulst}, N.F.",
year = "1995",
month = "10",
day = "26",
language = "English",
pages = "125--126",
note = "EOS Topical Meeting on Near Field Optics 1995 ; Conference date: 09-05-1995 Through 11-05-1995",

}

Jalocha, A, Moers, MHP, Ruiter, AGT & van Hulst, NF 1995, 'Multi-detection and polarization contrast in scanning near field optical microscopy in reflection' Paper presented at EOS Topical Meeting on Near Field Optics 1995, Brno, Czech Republic, 9/05/95 - 11/05/95, pp. 125-126.

Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. / Jalocha, A.; Moers, M.H.P.; Ruiter, A.G.T.; van Hulst, N.F.

1995. 125-126 Paper presented at EOS Topical Meeting on Near Field Optics 1995, Brno, Czech Republic.

Research output: Contribution to conferencePaperAcademicpeer-review

TY - CONF

T1 - Multi-detection and polarization contrast in scanning near field optical microscopy in reflection

AU - Jalocha, A.

AU - Moers, M.H.P.

AU - Ruiter, A.G.T.

AU - van Hulst, N.F.

PY - 1995/10/26

Y1 - 1995/10/26

M3 - Paper

SP - 125

EP - 126

ER -

Jalocha A, Moers MHP, Ruiter AGT, van Hulst NF. Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. 1995. Paper presented at EOS Topical Meeting on Near Field Optics 1995, Brno, Czech Republic.