Multi-detection and polarization contrast in scanning near field optical microscopy in reflection

A. Jalocha, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Research output: Contribution to conferencePaper

Original languageEnglish
Pages125-126
Number of pages2
Publication statusPublished - 26 Oct 1995
EventEOS Topical Meeting on Near Field Optics, NFO 1995 - Brno, Czech Republic
Duration: 9 May 199511 May 1995

Conference

ConferenceEOS Topical Meeting on Near Field Optics, NFO 1995
Abbreviated titleNFO
CountryCzech Republic
CityBrno
Period9/05/9511/05/95

Cite this

Jalocha, A., Moers, M. H. P., Ruiter, A. G. T., & van Hulst, N. F. (1995). Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. 125-126. Paper presented at EOS Topical Meeting on Near Field Optics, NFO 1995, Brno, Czech Republic.