Multi-detection and polarization contrast in scanning near field optical microscopy in reflection

A. Jalocha, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	125-126
Number of pages	2
Publication status	Published - 26 Oct 1995
Event	EOS Topical Meeting on Near Field Optics, NFO 1995 - Brno, Czech Republic Duration: 9 May 1995 → 11 May 1995

Conference	EOS Topical Meeting on Near Field Optics, NFO 1995
Abbreviated title	NFO
Country/Territory	Czech Republic
City	Brno
Period	9/05/95 → 11/05/95

Cite this

@conference{5e78e38be5094f31a2206c38907b12e3,

title = "Multi-detection and polarization contrast in scanning near field optical microscopy in reflection",

author = "A. Jalocha and M.H.P. Moers and A.G.T. Ruiter and \{van Hulst\}, N.F.",

year = "1995",

month = oct,

day = "26",

language = "English",

pages = "125--126",

note = "EOS Topical Meeting on Near Field Optics, NFO 1995, NFO ; Conference date: 09-05-1995 Through 11-05-1995",

}