Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy

I.J. Vera Marun, R. Jansen

    Research output: Contribution to journalArticleAcademicpeer-review

    3 Citations (Scopus)
    21 Downloads (Pure)

    Abstract

    We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.
    Original languageUndefined
    Article number10.1063/1.3068128
    Pages (from-to)07D520
    Number of pages3
    JournalJournal of Applied Physics
    Volume105
    Issue number7
    DOIs
    Publication statusPublished - 23 Feb 2009

    Keywords

    • IR-69069
    • METIS-264140
    • EWI-16487

    Cite this