Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy

I.J. Vera Marun; R. Jansen

doi:10.1063/1.3068128

Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy

I.J. Vera Marun, R. Jansen

Research output: Contribution to journal › Article › Academic › peer-review

4 Citations (Scopus)

37 Downloads (Pure)

Abstract

We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.

Original language	Undefined
Article number	10.1063/1.3068128
Pages (from-to)	07D520
Number of pages	3
Journal	Journal of Applied Physics
Volume	105
Issue number	7
DOIs	https://doi.org/10.1063/1.3068128
Publication status	Published - 23 Feb 2009

Keywords

IR-69069
METIS-264140
EWI-16487

Access to Document

10.1063/1.3068128

VeraMarun-JAP105-07D520-2009.R.Jansen

Cite this

@article{ceb379b94c084a10bad13d31c6852fed,

title = "Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy",

abstract = "We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.",

keywords = "IR-69069, METIS-264140, EWI-16487",

author = "{Vera Marun}, I.J. and R. Jansen",

note = "10.1063/1.3068128 ",

year = "2009",

month = feb,

day = "23",

doi = "10.1063/1.3068128",

language = "Undefined",

volume = "105",

pages = "07D520",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "7",

}

TY - JOUR

T1 - Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy

AU - Vera Marun, I.J.

AU - Jansen, R.

N1 - 10.1063/1.3068128

PY - 2009/2/23

Y1 - 2009/2/23

N2 - We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.

AB - We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.

KW - IR-69069

KW - METIS-264140

KW - EWI-16487

U2 - 10.1063/1.3068128

DO - 10.1063/1.3068128

M3 - Article

SN - 0021-8979

VL - 105

SP - 07D520

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 7

M1 - 10.1063/1.3068128

ER -