We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip.We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.
Vera Marun, I. J., & Jansen, R. (2009). Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy. Journal of Applied Physics, 105(7), 07D520. [10.1063/1.3068128]. https://doi.org/10.1063/1.3068128