Multivariate Model for Test Response Analysis

Shaji Krishnan; Hans G. Kerkhoff

doi:10.1109/ETSYM.2010.5512743

Multivariate Model for Test Response Analysis

Shaji Krishnan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.

Original language	English
Title of host publication	15th IEEE European Test Symposium (ETS 2010)
Place of Publication	USA
Publisher	IEEE
Pages	250-251
Number of pages	1
ISBN (Print)	978-1-4244-5834-9
DOIs	https://doi.org/10.1109/ETSYM.2010.5512743
Publication status	Published - 24 May 2010
Event	15th IEEE European Test Symposium, ETS 2010 - Prague, Czech Republic Duration: 24 May 2010 → 28 May 2010 Conference number: 15

Publication series

Name
Publisher	IEEE Computer Society
ISSN (Print)	1530-1877

Conference

Conference	15th IEEE European Test Symposium, ETS 2010
Abbreviated title	ETS
Country/Territory	Czech Republic
City	Prague
Period	24/05/10 → 28/05/10

Keywords

METIS-275791
IR-75308
CAES-TDT: Testable Design and Test
Fault coverage
EWI-19111
multivariate testing

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10.1109/ETSYM.2010.5512743

Cite this

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title = "Multivariate Model for Test Response Analysis",

abstract = "A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.",

keywords = "METIS-275791, IR-75308, CAES-TDT: Testable Design and Test, Fault coverage, EWI-19111, multivariate testing",

author = "Shaji Krishnan and Kerkhoff, {Hans G.}",

note = "Full paper available; 15th IEEE European Test Symposium, ETS 2010, ETS ; Conference date: 24-05-2010 Through 28-05-2010",

year = "2010",

month = may,

day = "24",

doi = "10.1109/ETSYM.2010.5512743",

language = "English",

isbn = "978-1-4244-5834-9",

publisher = "IEEE",

pages = "250--251",

booktitle = "15th IEEE European Test Symposium (ETS 2010)",

address = "United States",

}

TY - GEN

T1 - Multivariate Model for Test Response Analysis

AU - Krishnan, Shaji

AU - Kerkhoff, Hans G.

N1 - Conference code: 15

PY - 2010/5/24

Y1 - 2010/5/24

N2 - A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.

AB - A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.

KW - METIS-275791

KW - IR-75308

KW - CAES-TDT: Testable Design and Test

KW - Fault coverage

KW - EWI-19111

KW - multivariate testing

U2 - 10.1109/ETSYM.2010.5512743

DO - 10.1109/ETSYM.2010.5512743

M3 - Conference contribution

SN - 978-1-4244-5834-9

SP - 250

EP - 251

BT - 15th IEEE European Test Symposium (ETS 2010)

PB - IEEE

CY - USA

T2 - 15th IEEE European Test Symposium, ETS 2010

Y2 - 24 May 2010 through 28 May 2010

ER -

Multivariate Model for Test Response Analysis

Abstract

Publication series

Conference

Keywords

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