Multivariate Model for Test Response Analysis

Shaji Krishnan, Shaji Krishnan, Hans G. Kerkhoff

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    Abstract

    A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.
    Original languageUndefined
    Title of host publication15th IEEE European Test Symposium (ETS 2010)
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages250-251
    Number of pages1
    ISBN (Print)978-1-4244-5834-9
    DOIs
    Publication statusPublished - 24 May 2010
    Event15th IEEE European Test Symposium, ETS 2010 - Prague, Czech Republic
    Duration: 24 May 201028 May 2010
    Conference number: 15

    Publication series

    Name
    PublisherIEEE Computer Society
    ISSN (Print)1530-1877

    Conference

    Conference15th IEEE European Test Symposium, ETS 2010
    Abbreviated titleETS
    CountryCzech Republic
    CityPrague
    Period24/05/1028/05/10

    Keywords

    • METIS-275791
    • IR-75308
    • CAES-TDT: Testable Design and Test
    • Fault coverage
    • EWI-19111
    • multivariate testing

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