Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

W.C.L. Hopman, Kees van der Werf, Anton Hollink, R.M. de Ridder, W. Bogaerts, Vinod Subramaniam

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Abstract

We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.
Original languageEnglish
Pages (from-to)8745-8752
Number of pages8
JournalOptics express
Volume14
Issue number19
DOIs
Publication statusPublished - 18 Sep 2006

Keywords

  • IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES

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    Hopman, W. C. L., van der Werf, K., Hollink, A., de Ridder, R. M., Bogaerts, W., & Subramaniam, V. (2006). Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance. Optics express, 14(19), 8745-8752. https://doi.org/10.1364/OE.14.008745