Abstract
We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral
displacement at the strongest resonance antinode locations.
Original language | English |
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Pages (from-to) | 8745-8752 |
Number of pages | 8 |
Journal | Optics express |
Volume | 14 |
Issue number | 19 |
DOIs | |
Publication status | Published - 18 Sept 2006 |
Keywords
- IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES