Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

W.C.L. Hopman, Kees van der Werf, Anton Hollink, R.M. de Ridder, W. Bogaerts, Vinod Subramaniam

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Abstract

We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.
Original languageUndefined
Pages (from-to)8745-8752
Number of pages8
JournalOptics express
Volume14
Issue number19
DOIs
StatePublished - 18 Sep 2006

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Atomic force microscopy
Wavelength
Resonators
Silicon

Keywords

  • EWI-6851
  • METIS-235781
  • IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES
  • IR-66337

Cite this

Hopman, W. C. L., van der Werf, K., Hollink, A., de Ridder, R. M., Bogaerts, W., & Subramaniam, V. (2006). Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance. Optics express, 14(19), 8745-8752. DOI: 10.1364/OE.14.008745

Hopman, W.C.L.; van der Werf, Kees; Hollink, Anton; de Ridder, R.M.; Bogaerts, W.; Subramaniam, Vinod / Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance.

In: Optics express, Vol. 14, No. 19, 18.09.2006, p. 8745-8752.

Research output: Scientific - peer-reviewArticle

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abstract = "We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.",
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Hopman, WCL, van der Werf, K, Hollink, A, de Ridder, RM, Bogaerts, W & Subramaniam, V 2006, 'Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance' Optics express, vol 14, no. 19, pp. 8745-8752. DOI: 10.1364/OE.14.008745

Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance. / Hopman, W.C.L.; van der Werf, Kees; Hollink, Anton; de Ridder, R.M.; Bogaerts, W.; Subramaniam, Vinod.

In: Optics express, Vol. 14, No. 19, 18.09.2006, p. 8745-8752.

Research output: Scientific - peer-reviewArticle

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AU - Hopman,W.C.L.

AU - van der Werf,Kees

AU - Hollink,Anton

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AU - Bogaerts,W.

AU - Subramaniam,Vinod

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N2 - We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.

AB - We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.

KW - EWI-6851

KW - METIS-235781

KW - IOMS-PCS: PHOTONIC CRYSTAL STRUCTURES

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Hopman WCL, van der Werf K, Hollink A, de Ridder RM, Bogaerts W, Subramaniam V. Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance. Optics express. 2006 Sep 18;14(19):8745-8752. Available from, DOI: 10.1364/OE.14.008745