Nano-scale patterning of functional materials by soft lithography

A. George; David H.A. Blank; Johan E. ten Elshof

Nano-scale patterning of functional materials by soft lithography

A. George
, David H.A. Blank
, Johan E. ten Elshof

Inorganic Materials Science

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 15 Feb 2010
Event	Annual meeting CW studygroups "Chemistry of the solid state & materials science" and "Crystallography and structural research" - Veldhoven Duration: 15 Feb 2010 → 16 Feb 2010

Conference

Conference	Annual meeting CW studygroups "Chemistry of the solid state & materials science" and "Crystallography and structural research"
City	Veldhoven
Period	15/02/10 → 16/02/10

Keywords

METIS-269566

Cite this

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title = "Nano-scale patterning of functional materials by soft lithography",

keywords = "METIS-269566",

author = "A. George and Blank, \{David H.A.\} and \{ten Elshof\}, \{Johan E.\}",

year = "2010",

month = feb,

day = "15",

language = "Undefined",

pages = "--",

note = "Annual meeting CW studygroups \"Chemistry of the solid state \& materials science\" and \"Crystallography and structural research\" ; Conference date: 15-02-2010 Through 16-02-2010",

}

Nano-scale patterning of functional materials by soft lithography. / George, A.; Blank, David H.A.; ten Elshof, Johan E.
2010. - Poster session presented at Annual meeting CW studygroups "Chemistry of the solid state & materials science" and "Crystallography and structural research", Veldhoven.

Research output: Contribution to conference › Poster › Other research output

TY - CONF

T1 - Nano-scale patterning of functional materials by soft lithography

AU - George, A.

AU - Blank, David H.A.

AU - ten Elshof, Johan E.

PY - 2010/2/15

Y1 - 2010/2/15

KW - METIS-269566

M3 - Poster

SP - -

T2 - Annual meeting CW studygroups "Chemistry of the solid state & materials science" and "Crystallography and structural research"

Y2 - 15 February 2010 through 16 February 2010

ER -