Nanoscale Control of Exchange Bias with BiFeO3 Thin Films

Lane W. Martin, Ying-Hao Chu, Mikel B. Holcomb, Mark Huijben, Pu Yu, Shu-Jen Han, Donkoun Lee, Shan X. Wang, R. Ramesh

Research output: Contribution to journalArticleAcademic

250 Citations (Scopus)

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Engineering & Materials Science

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