Nanoscale electrical characterisation of high-K metal oxides

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 22 Jun 2003
EventAIO Workshop on Advanced Scanning Probe Methods 2003 - Hollum, Ameland
Duration: 22 Jun 200327 Jun 2003

Conference

ConferenceAIO Workshop on Advanced Scanning Probe Methods 2003
CityHollum, Ameland
Period22/06/0327/06/03

Keywords

  • METIS-214774

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