As miniaturization continues, layers in devices are made thinner and their properties become increasingly difficult to measure. There are techniques available to measure a wide range of properties of materials at nanometer length scales and measure the extremely small signals that they produce. This thesis focusses on the use of such techniques to measure structural, stoichiometric, and magnetic properties of samples. Three different material systems will be presented, each of which zooms in on a different aspect of analysis. Their commonality is that they are oxide materials and are all in thin film form deposited on an oxide substrate.
|Award date||17 Apr 2008|
|Place of Publication||Enschede|
|Publication status||Published - 17 Apr 2008|