Nanoscale properties of complex oxide films

Wolter Siemons

doi:10.3990/1.9789036526395

Nanoscale properties of complex oxide films

Wolter Siemons

Inorganic Materials Science

Research output: Thesis › PhD Thesis - Research UT, graduation UT

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Abstract

As miniaturization continues, layers in devices are made thinner and their properties become increasingly difficult to measure. There are techniques available to measure a wide range of properties of materials at nanometer length scales and measure the extremely small signals that they produce. This thesis focusses on the use of such techniques to measure structural, stoichiometric, and magnetic properties of samples. Three different material systems will be presented, each of which zooms in on a different aspect of analysis. Their commonality is that they are oxide materials and are all in thin film form deposited on an oxide substrate.

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	University of Twente
Supervisors/Advisors	Blank, D.H.A., Supervisor Beasley, M.R., Supervisor, External person Koster, Gertjan, Co-Supervisor
Award date	17 Apr 2008
Place of Publication	Enschede
Publisher	University of Twente
Print ISBNs	978-90-365-2639-5
DOIs	https://doi.org/10.3990/1.9789036526395
Publication status	Published - 17 Apr 2008

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title = "Nanoscale properties of complex oxide films",

abstract = "As miniaturization continues, layers in devices are made thinner and their properties become increasingly difficult to measure. There are techniques available to measure a wide range of properties of materials at nanometer length scales and measure the extremely small signals that they produce. This thesis focusses on the use of such techniques to measure structural, stoichiometric, and magnetic properties of samples. Three different material systems will be presented, each of which zooms in on a different aspect of analysis. Their commonality is that they are oxide materials and are all in thin film form deposited on an oxide substrate.",

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U2 - 10.3990/1.9789036526395

DO - 10.3990/1.9789036526395

M3 - PhD Thesis - Research UT, graduation UT

SN - 978-90-365-2639-5

PB - University of Twente

CY - Enschede

ER -

Nanoscale properties of complex oxide films

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