Nanoscale properties of complex oxide films

Wolter Siemons

Research output: ThesisPhD Thesis - Research UT, graduation UT

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Abstract

As miniaturization continues, layers in devices are made thinner and their properties become increasingly difficult to measure. There are techniques available to measure a wide range of properties of materials at nanometer length scales and measure the extremely small signals that they produce. This thesis focusses on the use of such techniques to measure structural, stoichiometric, and magnetic properties of samples. Three different material systems will be presented, each of which zooms in on a different aspect of analysis. Their commonality is that they are oxide materials and are all in thin film form deposited on an oxide substrate.
Original languageEnglish
Awarding Institution
  • University of Twente
Supervisors/Advisors
  • Blank, D.H.A., Supervisor
  • Beasley, M.R., Supervisor, External person
  • Koster, Gertjan, Co-Supervisor
Award date17 Apr 2008
Place of PublicationEnschede
Publisher
Print ISBNs978-90-365-2639-5
Publication statusPublished - 17 Apr 2008

Keywords

  • IR-58866

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