Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers

Aysegul Cumurcu, Joost Duvigneau, Ian D. Lindsay, Peter Schön, G. Julius Vancso* (Corresponding Author)

*Corresponding author for this work

Research output: Contribution to journalConference articleAcademicpeer-review

Abstract

In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.

Original languageEnglish
Article numbermrsf13-1652-ll06-03
JournalMaterials Research Society Symposium Proceedings
Volume1562
DOIs
Publication statusPublished - 1 Jan 2013
EventMRS Spring Meeting & Exhibit 2013 - San Francisco, United States
Duration: 1 Apr 20135 Apr 2013

Keywords

  • Nanoscale
  • Optical properties
  • Scanning probe microscopy (SPM)

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