Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers

Aysegul Cumurcu, Joost Duvigneau, Ian D. Lindsay, Peter Schön, G. Julius Vancso* (Corresponding Author)

*Corresponding author for this work

Research output: Contribution to journalConference articleAcademicpeer-review

Abstract

In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.

Original languageEnglish
Article numbermrsf13-1652-ll06-03
JournalMaterials Research Society Symposium Proceedings
Volume1562
DOIs
Publication statusPublished - 1 Jan 2013
EventMRS Spring Meeting & Exhibit 2013 - San Francisco, United States
Duration: 1 Apr 20135 Apr 2013

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near fields
Microscopic examination
Polymers
Microscopes
microscopes
microscopy
block copolymers
Scanning
Imaging techniques
Block copolymers
scanning
polymers
Near field scanning optical microscopy
ellipsometers
Silicon
curves
Polymer films
Gold
optical communication
far fields

Keywords

  • Nanoscale
  • Optical properties
  • Scanning probe microscopy (SPM)

Cite this

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title = "Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers",
abstract = "In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.",
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year = "2013",
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Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers. / Cumurcu, Aysegul; Duvigneau, Joost; Lindsay, Ian D.; Schön, Peter; Vancso, G. Julius (Corresponding Author).

In: Materials Research Society Symposium Proceedings, Vol. 1562, mrsf13-1652-ll06-03, 01.01.2013.

Research output: Contribution to journalConference articleAcademicpeer-review

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AU - Cumurcu, Aysegul

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AU - Vancso, G. Julius

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AB - In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.

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