In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.
|Journal||Materials Research Society Symposium Proceedings|
|Publication status||Published - 1 Jan 2013|
|Event||MRS Spring Meeting & Exhibit 2013 - San Francisco, United States|
Duration: 1 Apr 2013 → 5 Apr 2013
- Optical properties
- Scanning probe microscopy (SPM)