Nanoscale Subsurface Morphologies in Block Copolymer Thin Films Revealed by Combined Near-Field Infrared Microscopy and Mechanical Mapping

Kevin Ho, K.S. Kim, L. Gilburd, Ruben Mirzoyan, Sissi de Beer, G.C. Walker*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Block copolymer (BCP) thin films are commonly characterized by techniques that either lack nanometric spatial resolution or the ability for subsurface characterization. In this work, we combine scanning near-field optical microscopy and atomic force microscopy mechanical mapping to probe the subsurface composition of poly(styrene-block-tert-butyl acrylate) thin film with nanometric spatial resolution and compare our results to a theoretical description. Our work demonstrates a novel imaging approach for interrogating the internal morphology of BCP thin films. A better understanding of subsurface morphologies will enable better design principles for nanolithography and templating thin films for photonics, photovoltaics, and tissue engineering.
Original languageEnglish
Pages (from-to)933-938
JournalACS Applied Polymer Materials
Volume1
Issue number5
DOIs
Publication statusPublished - 10 May 2019

Keywords

  • near-field optical microscopy
  • subsurface imaging
  • atomic force microscopy
  • mechanical properties
  • block copolymer
  • thin film

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