Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopy

Timm Swoboda, Nicolás Wainstein, Sanchit Deshmukh, Çağıl Köroğlu, Xing Gao, Mario Lanza, Hans Hilgenkamp, Eric Pop, Eilam Yalon, Miguel Muñoz Rojo*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
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