Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties

J.M. Sturm, A.I. Zinine, H. Wormeester, B. Poelsema, R.G. Bankras, J. Holleman, J. Schmitz

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)
42 Downloads (Pure)

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