Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Anirudhan Chandrasekaran*, Robbert W.E. van de Kruijs, J.M. Sturm, Andrey Zameshin, F. Bijkerk

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

16 Citations (Scopus)
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