Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Anirudhan Chandrasekaran^*
, Robbert W.E. van de Kruijs
, J.M. Sturm
, Andrey Zameshin
, F. Bijkerk

^*Corresponding author for this work

XUV Optics

Research output: Contribution to journal › Article › Academic › peer-review

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2022
Surface and interface diffusion processes in nanoscale thin films
Chandrasekaran, A., 16 Nov 2022, Enschede: University of Twente. 128 p.
Research output: Thesis › PhD Thesis - Research UT, graduation UT

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