Nanosheet controlled epitaxial growth of PbZr0.52Ti0.48O3 thin films on glass substrates

Research output: Contribution to journalArticleAcademicpeer-review

19 Citations (Scopus)
202 Downloads (Pure)


Integration of PbZr0.52Ti0.48O3 (PZT) films on glass substrates is of high importance for device applications. However, to make use of the superior ferro- and piezoelectric properties of PZT, well-oriented crystalline or epitaxial growth with control of the crystal orientation is a prerequisite. In this article, we report on epitaxial growth of PZT films with (100)- and (110)-orientation achieved by utilizing Ca2Nb3O10 (CNO) and Ti0.87O2 (TO) nanosheets as crystalline buffer layers. Fatigue measurements demonstrated stable ferroelectric properties of these films up to 5 × 109 cycles. (100)-oriented PZT films on CNO nanosheets show a large remnant polarization of 21 μC/cm2 that is the highest remnant polarization value compared to (110)-oriented and polycrystalline films reported in this work. A piezoelectric response of 98 pm/V is observed for (100)-oriented PZT film which is higher than the values reported in the literature on Si substrates
Original languageEnglish
Article number132904
Pages (from-to)132904-
JournalApplied physics letters
Issue number13
Publication statusPublished - 2014


  • METIS-305301
  • IR-91962


Dive into the research topics of 'Nanosheet controlled epitaxial growth of PbZr0.52Ti0.48O3 thin films on glass substrates'. Together they form a unique fingerprint.

Cite this