Nanosheet controlled epitaxial growth of PbZr0.52Ti0.48O3 thin films on glass substrates

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)
83 Downloads (Pure)

Abstract

Integration of PbZr0.52Ti0.48O3 (PZT) films on glass substrates is of high importance for device applications. However, to make use of the superior ferro- and piezoelectric properties of PZT, well-oriented crystalline or epitaxial growth with control of the crystal orientation is a prerequisite. In this article, we report on epitaxial growth of PZT films with (100)- and (110)-orientation achieved by utilizing Ca2Nb3O10 (CNO) and Ti0.87O2 (TO) nanosheets as crystalline buffer layers. Fatigue measurements demonstrated stable ferroelectric properties of these films up to 5 × 109 cycles. (100)-oriented PZT films on CNO nanosheets show a large remnant polarization of 21 μC/cm2 that is the highest remnant polarization value compared to (110)-oriented and polycrystalline films reported in this work. A piezoelectric response of 98 pm/V is observed for (100)-oriented PZT film which is higher than the values reported in the literature on Si substrates
Original languageEnglish
Article number132904
Pages (from-to)132904-
JournalApplied physics letters
Volume105
Issue number13
DOIs
Publication statusPublished - 2014

Keywords

  • METIS-305301
  • IR-91962

Fingerprint Dive into the research topics of 'Nanosheet controlled epitaxial growth of PbZr0.52Ti0.48O3 thin films on glass substrates'. Together they form a unique fingerprint.

Cite this