Naval Topside EM Modeling and Validation

Jasper van der Graaff, Frank Leferink

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Abstract

    We need confidence in simulation tools and to replace scale model and full-scale measurements in the optimisation process during the design.
    Original languageEnglish
    Title of host publicationVI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology
    Subtitle of host publicationthe proceedings
    Place of PublicationPiscataway, NJ, USA
    PublisherIEEE Computer Society
    Pages292-295
    Number of pages4
    ISBN (Print)0-7803-9374-0
    DOIs
    Publication statusPublished - 23 Jun 2005
    EventIEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005 - St. Petersburg, Russia, St. Petersburg, Russian Federation
    Duration: 21 Jun 200524 Jun 2005

    Conference

    ConferenceIEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005
    CountryRussian Federation
    CitySt. Petersburg
    Period21/06/0524/06/05
    Other21-24 June 2005

    Keywords

    • EWI-15645
    • METIS-225859
    • IR-76068

    Cite this

    van der Graaff, J., & Leferink, F. (2005). Naval Topside EM Modeling and Validation. In VI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology: the proceedings (pp. 292-295). Piscataway, NJ, USA: IEEE Computer Society. https://doi.org/10.1109/EMCECO.2005.1513127