Naval Topside EM Modeling and Validation

Jasper van der Graaff; Frank Leferink

doi:10.1109/EMCECO.2005.1513127

Naval Topside EM Modeling and Validation

Jasper van der Graaff
, Frank Leferink

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

We need confidence in simulation tools and to replace scale model and full-scale measurements in the optimisation process during the design.

Original language	English
Title of host publication	VI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology
Subtitle of host publication	the proceedings
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	292-295
Number of pages	4
ISBN (Print)	0-7803-9374-0
DOIs	https://doi.org/10.1109/EMCECO.2005.1513127
Publication status	Published - 23 Jun 2005
Event	IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005 - St. Petersburg, Russia, St. Petersburg, Russian Federation Duration: 21 Jun 2005 → 24 Jun 2005

Conference

Conference	IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005
Country/Territory	Russian Federation
City	St. Petersburg
Period	21/06/05 → 24/06/05
Other	21-24 June 2005

Keywords

EWI-15645
METIS-225859
IR-76068

Access to Document

10.1109/EMCECO.2005.1513127

Cite this

@inproceedings{d07670c6f08b48f78a56607c23c31775,

title = "Naval Topside EM Modeling and Validation",

abstract = "We need confidence in simulation tools and to replace scale model and full-scale measurements in the optimisation process during the design.",

keywords = "EWI-15645, METIS-225859, IR-76068",

author = "\{van der Graaff\}, Jasper and Frank Leferink",

year = "2005",

month = jun,

day = "23",

doi = "10.1109/EMCECO.2005.1513127",

language = "English",

isbn = "0-7803-9374-0",

pages = "292--295",

booktitle = "VI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology",

publisher = "IEEE",

address = "United States",

note = "IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005 ; Conference date: 21-06-2005 Through 24-06-2005",

}

van der Graaff, J & Leferink, F 2005, Naval Topside EM Modeling and Validation. in VI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology: the proceedings. IEEE, Piscataway, NJ, USA, pp. 292-295, IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005, St. Petersburg, Russian Federation, 21/06/05. https://doi.org/10.1109/EMCECO.2005.1513127

TY - GEN

T1 - Naval Topside EM Modeling and Validation

AU - van der Graaff, Jasper

AU - Leferink, Frank

PY - 2005/6/23

Y1 - 2005/6/23

N2 - We need confidence in simulation tools and to replace scale model and full-scale measurements in the optimisation process during the design.

AB - We need confidence in simulation tools and to replace scale model and full-scale measurements in the optimisation process during the design.

KW - EWI-15645

KW - METIS-225859

KW - IR-76068

U2 - 10.1109/EMCECO.2005.1513127

DO - 10.1109/EMCECO.2005.1513127

M3 - Conference contribution

SN - 0-7803-9374-0

SP - 292

EP - 295

BT - VI International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology

PB - IEEE

CY - Piscataway, NJ, USA

T2 - IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology 2005

Y2 - 21 June 2005 through 24 June 2005

ER -

Naval Topside EM Modeling and Validation

Abstract

Conference

Keywords

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