Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

R. Eckert, J.M. Freyland, H. Gersen, H. Heinzelmann, G. Schurmann, W. Noell, U. Staufer, N.F. de Rooij

Research output: Contribution to journalArticleAcademicpeer-review

74 Citations (Scopus)
Original languageUndefined
Pages (from-to)3695-3697
Number of pages3
JournalApplied physics letters
Volume77
Issue number23
Publication statusPublished - 2000

Keywords

  • METIS-128630

Cite this

Eckert, R., Freyland, J. M., Gersen, H., Heinzelmann, H., Schurmann, G., Noell, W., ... de Rooij, N. F. (2000). Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes. Applied physics letters, 77(23), 3695-3697.