Near field Optical Microscopy in transmission and reflection, combined with force microscopy

N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman, F. Achten, F.B. Segerink, B. Bölger

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationMICRO'92
Subtitle of host publicationInternational Symposium on Microarchitecture
EditorsP.J. Evennett
Place of PublicationLondon, U.K.
PublisherSeacourt Press
Pages147-147
Number of pages1
Publication statusPublished - 7 Jul 1992

Publication series

NameProceedings of the Royal Microscopical Society
PublisherRoyal Microscopical Society
Number3
Volume27
ISSN (Print)0035-9017

Cite this

van Hulst, N. F., Moers, M. H. P., Noordman, O. F. J., Achten, F., Segerink, F. B., & Bölger, B. (1992). Near field Optical Microscopy in transmission and reflection, combined with force microscopy. In P. J. Evennett (Ed.), MICRO'92: International Symposium on Microarchitecture (pp. 147-147). (Proceedings of the Royal Microscopical Society; Vol. 27, No. 3). London, U.K.: Seacourt Press.